|
|
|
Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find analysis x ray-related products, suppliers, datasheets and CAD.
 |
FREE GlobalSpec e-Newsletters
Receive the latest news, trends, and technology relevant to your work. (See Titles) |
Products/Services for analysis x ray
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More
...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More
Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF Search by Specification | Learn More
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More
, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More
...by capillary action. Non-destructive testing (NDT) services with radiographic or X-ray equipment use penetrating X-rays or gamma rays to capture images of the internal structure or a part or finished product. The density and composition... Search by Specification | Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
...use sieving, dynamic light scattering, electrozone sensing, laser diffraction, low angle light scattering (LALLS), microscopy, or sedimentation. Companies that perform X-ray radiography, scanning acoustic microscopy (SAM), auger spectroscopy (AES... Search by Specification | Learn More
...systems, and walkthrough weapons detectors. Security system services that rent, lease, and train law enforcement personnel how to use X-ray scanners are also available. Selecting security system services requires an analysis of application... Learn More
...include radiography or X-ray analysis, laser holography or gaging, penetrant testing, and magnetic particle testing. Acoustic emission instruments and noise detectors are non-destructive testing (NDT) supplies and accessories for monitoring... Search by Specification | Learn More
|
||||||||
SE-Series Environmental Test Chambers Thermotron Industries
VTM Rheometer Dynisco Plastics
Economy SSTM Series United Testing Systems, Inc.
Super-Long-Beam Flex Tester United Testing Systems, Inc.
Wire Rope, Chain & Cable - Tensile Strength AJT Equipment Limited
Tensile System with Heated Saline Bath United Testing Systems, Inc.
|
Product News for analysis x ray
Material Analysis with X-ray Spectrometers
X-Ray fluorescence is a highly effective tool for materials analysis.
It is widely used for coating thickness measurement and is also well suited for element identification.
Powder and paste can be analyzed in the same manner as solid materials or liquids. Fast results are possible with our X-Ray Fluorescence Testing for WEEE and RoHS compliance. (read more)
PXS10-65W/PXS10-800 130 kV MicroFocus X-ray Source
The PXS10-65W and PXS10-800 are MicroFocus X-Ray sources for applications requiring high power and high resolution. They operate from 45kV-130kV at up to 65W. They offer <6µm spot size and FOD of 14mm for excellent resolution and magnification. The completely integrated units combine a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS10-16W 130 kV MicroFocus X-ray Source
The PXS10-16W is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 45kV - 130kV at up to 16W. It offers focal spot size down to <5µm and a focus-to-object distance of 14mm for excellent resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS5-925EA, 90 kV MicroFocus X-Ray Source
The PXS5-925EA is a MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV-90kV at up to 8W. It features a focal spot down to 7µm and a Focus-to-Object Distance (FOD) of 12mm for excellent resolution and magnification. The compact case houses an end-window sealed tube and high voltage power supply in a unit weighing only 8lbs. (read more)
PXS5-724EA, 70 kV MicroFocus X-Ray Source
The PXS5-724EA is an end-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 70kV at up to 7W. The focal spot is <20µm at 7W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
PXS5-927, 90 kV MicroFocus X-Ray Source
The PXS5-927 is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 20kV - 90kV at up to 8W. It features a round focal spot with size down to 4µm and a working distance of 8.5mm for outstanding resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS5-822SA, 80 kV MicroFocus X-Ray Source
The PXS5-822SA is a side-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 80kV at up to 8W. The focal spot is <20µm at 8W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
PXS11-150-75, 75 kV Mini-Focus X-Ray Source
The PXS11-150-75 is a Mini-Focus X-Ray source for high resolution radiographic and real time imaging applications. It operates from 40kV - 75kV at up to 11.25W. It features a focal spot size of 45µm at 11.25W and a working distance of 8.9mm for high resolution and magnification. The unit combines a sealed tube, high voltage power supply and control circuitry in a robust and compact package. (read more)
PXS5-926EA, 90 kV MicroFocus X-Ray Source
The PXS5-926EA is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 45kV - 90kV at up to 8W. It features a <5µm focal spot and a Focus-to-Object Distance of 8.5mm for outstanding resolution and magnification. The unit combines a sealed tube and high voltage power supply in a compact package weighing only 8lbs. (read more)
PXS4-611W, 60 kV X-Ray Source
The PXS4-611W is a water cooled side-window X-Ray source for analytical and gauging applications. It features highly stable flux for reliable gauging measurements. Operating voltage is from 5kV - 60kV at up to 60W. The focal spot is 0.25mm x 0.45mm at 60W and the Focus-to-Object Distance (FOD) is 15.8mm. The unit houses a sealed tube and high voltage power supply. (read more)
Conduct Research
-
Simultaneous XRD/XRF with Low-Power X-Ray Tubes
A test bench instrument constructed at MOXTEK, Inc. is capable of simultaneously capturing X-ray diffraction (XRD) and X-ray fluorescence (XRF) information using a charge-coupled device (CCD) as the...(read more)
-
AP3 Windows: Ultra-Thin Polymer X-Ray Windows
AP3 ultra-thin polymer windows are the highest performing x-ray windows available for low energy x-ray analysis. AP3 windows are ideal for applications that require high x-ray transmission of light...(read more)
-
Improvements in Low Power, End-Window, Transmission-Target X-Ray Tubes
End-window transmission-target X-ray tubes are designed for very close anode-to-sample coupling for compact portable XRF instruments. Several recent improvements have been achieved to make these tubes...(read more)
-
Determining Gemstone Authenticity and Precious Metal Purities by Energy Dispersive X-Ray Fluorescence Spectroscopy
Gemstones have been known to undergo various manipulations to enhance their perceived quality. As technology advances, confirming the authenticity of gemstones becomes more and more difficult,...(read more)
-
X-Ray Diffraction Characterization of Residual Stress and Hardness Distribution in Induction Hardened Gears (.pdf)
Accurate knowledge of the subsurface residual stress and hardness distributions is required for failure analysis, fatigue life prediction and process control of induction hardened components. X-ray...(read more)
-
X-ray Diffraction Characterization Of Crystallinity And Phase Composition In Plasma-sprayed Hydroxylapatite Coatings (.pdf)
Orthopedic and dental implants consisting of a metallic substrate plasma-spray coated with hydroxylapatite (HA) are currently used in reconstructive surgery. The crystalline phases present in the...(read more)
-
The Identification of Crystalline Phases in Boiler Scale Deposits by X-Ray Diffraction (.pdf)
The analysis of boiler scale water deposits is an important tool both for maintenance of power generation systems and for failure analysis. Loss of heat transfer efficiency, increased fuel...(read more)
-
An XRD/XRF Instrument for the Microanalysis of Rocks and Minerals
A breadboard setup constructed at MOXTEK, Inc., is capable of capturing both x-ray diffraction (XRD) and x-ray fluorescence (XRF) information simultaneously using a charge-coupled device (CCD) as the...(read more)
-
In Search of Consistency
Traditional Bragg-Brentano X-ray diffractometers require precise positioning of source, sample and detector. These limitations, along with large size, make them unsuitable for in-line measurements....(read more)
-
Secondary Structure Analysis of Proteins Using IR Imaging
The IMV-4000 enables infrared imaging by a figure of two or more faster than using a conventional single element detector. A technique that quickly analyzes the results is also desirable. JASCO has...(read more)
|
X-ray - Wikipedia, the free encyclopedia Originally, the electromagnetic radiation emitted by X-ray tubes had a longer wavelength than the radiation emitted by radioactive nuclei (gamma |
|
|
The Chandra X-ray Observatory Center :: Gateway to the... NASA's Chandra X-ray Observatory is a telescope specially designed to detect X-ray emission from very hot regions of the Universe such as exploded |
|
|
Chandra X-Ray Observatory Homepage Data Analysis Archive Proposer CXC Home Data Analysis > CIAO Software Package Data Analysis Threads |
|
|
X-ray Observations of Eta Car Our RXTE analysis of the 2-10 keV X-ray spectrum (Ishibashi et al., ApJ 1999, in press; the postscript version of the paper, and figures, and the |
|
|
HEASARC: XMM-Newton Guest Observer Facility XMM-Newton, the X-ray Multi-Mirror Mission, is the second cornerstone of the Horizon 2000 program of the European Space Agency (ESA). XMM-Newton was |
|
|
XRF & Full pattern XRD without compromise!-Thermo Scientific |
|
|
Microbeam XRF Benchtop System-Thermo Scientific Product Browse Products >>... >> X-Ray Spectroscopy - Diffractometry >> Microbeam XRF MicroXR GXR Microbeam X-ray Fluorescence System |
|
|
1996 Building Publications - Guide for X-Ray Powder... Guide for X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
|
|
1996 Building Publications - Pattern Fitting for Quantitative... Pattern Fitting for Quantitative X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
|
|
Welcome to phoenix|x-ray! About phoenix|x-ray phoenix|x-ray is the product-line of GE Sensing & Inspection Technologies for See phoenix | x-ray Systems + Services Inc. Information |
| Sponsored Results |
|
Siemens - Medical X-Ray and Imaging
Siemens Healthcare technology helps improve patient outcomes and reduce healthcare cost. Siemens Answers for Healthcare www.usa.siemens.com/answers |
| See your message here... |
More >>
