Charge coupled device (CCD) cameras contain light-sensitive silicon chips that detect electrons excited by incoming light. They also contain micro circuitry that transfers a detected signal along a row of discrete picture elements or pixels, scanning the image very rapidly. CCD cameras use two-dimensional CCD arrays with many thousand of pixels. Search by Specification | Learn More

X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More

...position, bar or matrix code, optical character recognition (OCR), and color mark or color recognition. Imaging technology used in vision sensors includes CCD, CMOS, tube, and film. Charge Coupled Devices (CCD) use a light-sensitive material... Search by Specification | Learn More

...image. They typically employ color separation devices such as beamsplitters rather than having integral filters on the sensors. Choices for imaging technologies for video cameras include CCD, CMOS, tube, and film. Charge Coupled Devices (CCD) use... Search by Specification | Learn More

...speed cameras include CCD, CMOS, tube, and film. Charge Coupled Devices (CCD) use a light-sensitive material on a silicon chip to detect electrons excited by incoming light. They also contain integrated microcircuitry required to transfer the detected... Search by Specification | Learn More

...available, along with alarms and changes in state of switches. Typically, the sensing component for optical triangulation position sensors is either a charged coupled device (CCD) or a photodiode (PSD). The sampling rate is important... Search by Specification | Learn More

Complementary metal oxide semiconductor (CMOS) cameras use image sensors that operate at lower voltages than charged coupled devices (CCDs), reducing power consumption for portable applications. Each CMOS active pixel sensor cell has its own buffer amplifier, and can be addressed and read individually. Search by Specification | Learn More

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More

...are used for color balancing, matching CCD or other sensor sensitivity ranges, emphasizing or blocking ranges of spectra such as ultraviolet, infrared, or portions of the visible spectrum (colors). Camera filters are available in many styles include... Search by Specification | Learn More

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More

CCD) or contact image sensor (CIS) as their imaging-sensing component. Most image scanners read red-green-blue (RGB) color from an array, and then transfer the scanned image to a computer. Product specifications include the way in which the image... Learn More

Camera lenses and video lenses attach to video cameras for use in machine vision, quality monitoring, security, and remote monitoring for industrial and commercial operations. This search form does not cover consumer video camera lenses. Search by Specification | Learn More

Test equipment and instrument repair services test and repair industrial equipment and instruments. They specialize in the test and repair of acoustic and vibration equipment, electrical and electronic test equipment, laboratory equipment and instruments, inspection instruments or non-destructive testing (NDT) equipment, or specialty testing equipment and instruments. Search by Specification | Learn More

Linear position sensors is a general search form for all linear position / displacement detection product areas. Search by Specification | Learn More