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Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
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Products/Services for IC inspection
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
Machine vision systems are used for automated inspection and measurement in production environments. Search by Specification | Learn More about Machine Vision Systems
Inspection services examine products, parts, equipment, repairs, services, installations, and facilities to ensure quality, consistency, and condition, as well as conformance to required standards and/or procedures. Search by Specification | Learn More about Inspection Services
IC sockets and headers are board-mounted female connectors that serve as carriers for integrated circuit (IC) chips. Search by Specification | Learn More about IC Sockets and Headers
IC package converters and adapters are electronic interconnect devices that are used to interface different types of integrated circuit (IC) sockets. Search by Specification | Learn More about IC Package Converters and Adapters
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
IC sockets and interconnect components interface or connect a microelectronic semiconductor chip to a board or larger scale device. Search by Specification | Learn More about IC Sockets and Interconnect Components
Frame grabbers are image processing computer boards that capture and store image data for industrial applications such as quality control. Search by Specification | Learn More about Frame Grabbers
Construction and building inspection services include lab or field testing, analysis and monitoring of structures and building materials such as foundations, drainage systems, pavement, concrete, soils and reinforcing or structural steel. Search by Specification | Learn More about Construction and Building Inspection Services
Inspection accessories, layout accessories and gaging accessories include probes, sensors, hand tools, styli, contact tips, supplies and other components for dimensional measurement, inspecting, marking, layout or other manufacturing or machine shop Learn More about Inspection, Layout and Gaging Accessories
...ray instruments and X-ray systems. They are system components that generate X-rays or gamma rays for radiographic inspection. Microfocus systems are X-ray instruments and X-ray systems that use fine focus X-ray tubes. By focusing on very small... Search by Specification | Learn More about X-ray Instruments and X-ray Systems
...methods. Eddy current instruments induce detectable eddy currents in conductive materials, providing information for applications such as flaw detection, thickness determination, weld inspection, conductivity measurement, alloy sorting, and heat... Search by Specification | Learn More about Nondestructive Testing (NDT) Material Testers
Web inspection equipment is used for the detection and/or automatic identification of web or web coating patterns and defects or problems such as streaks and blurs. Learn More about Web Inspection Equipment
...for microscopes include manufacturing inspection and high-technology quality control. Specific quality control applications for microscopes include semiconductor processing, medical imaging, cell research, and metallurgical analysis. Microscopes... Search by Specification | Learn More about Microscopes
IC voltage regulators are three-terminal devices that provide a constant DC output voltage that is independent of the input voltage, output load current, and temperature. IC voltage regulators are used in power supplies Search by Specification | Learn More about IC Voltage Regulators
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Automated 3D Wafer Metrology Tool DWFritz Automation, Inc.
Semiconductor Thickness -- CHRocodile MI5 Precitec, Inc.
Silicon Ingot Inspection System DWFritz Automation, Inc.
Motorized Semiconductor Wafer Shuttle Stage Prior Scientific, Inc.
Custom Thin Film Equipment Consarc - An Inductotherm Group Company
Univex Coating Systems Oerlikon Leybold Vacuum USA Inc.
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Product News for IC inspection
Rigging and Safety Inspections
An important part of their business at Dakota Riggers is providing inspections for the various rigging products that they sell their customers. Dakota performs hands-on inspections for wire rope slings, synthetic slings, cordage, alloy chains slings, lifting clamps, specialty lifting devices, and hand hoists. (read more)
FDA-Related Services & Third Party FDA Inspections
TÜV SÜD America is authorized by the FDA to submit 510(k) applications on behalf of medical device manufacturers for all eligible Class I & II devices and to provide Third-Party FDA Inspections. In addition to helping with US market regulations, TUV can provide market access to Europe, Canada and Japan, offering manufacturers a single-source solution to their regulatory needs. (read more)
Lifting Equipment Inspections
Ontario Regulation 851 section 51 states that a lifting device must be inspected by a competent person at least once a year.
Givens Engineering performs annual inspections on cranes, manipulators and below-the-hook lifting devices. Each device is inspected at your plant by one of our technicians. An inspection consists of:
- An inspection of all accessible fasteners to en... (read more)
OSHA Inspections by Shupper-Brickle Equipment
With a routine OSHA Inspection from Shupper-Brickle Equipment Company, your hoists, trolleys, bridge cranes and jibs can be up to code in no time. (read more)
Aerial Equipment Inspection and Crane Inspection
The inspections performed by Non-Destructive Testing Group, Inc. (NDT Group) will assure that the equipment tested meets all state and federal safety codes, in addition to full compliance with inspection standards and recommendations. (read more)
iC-MQ: Encoder evaluation with x100 interpolation
iC-MQ provides up to 400 angle steps for sine interpolation; to improve angle accuracy, this basic function is supplemented by a finely adjustable signal conditioning circuitry, a signal path multiplexer (which keeps pin functions variable) and fault-tolerant RS422 line drivers. Device installation with incorrectly connected wires is tolerated by iC-MQ even when supply voltage is reversed. (read more)
iC-HK/B Laser switch
The iC-HK/B laser Switch enables the spike-free switching of laser diodes with well-defined current pulses at frequencies ranging from DC to 155 MHz. (read more)
iC-GF: Sensor I/O
iC-GF is a monolithic interface iC with two independent switching channels which enables digital sensors to drive peripheral elements, such as programmable logic controllers (PLC) and relays, for example. All functions are controlled either by pins or via SPI interface, with extended functionality and configurability in SPI mode. (read more)
iC-ML Hall Position Sensor/Encoder
The iC-ML supplies the absolute linear position of a magnetic tape placed above the chip's package, with a Hall sensor array granting a reasonable system assembly tolerance. Controlled signal amplitudes are ensured by the embedded signal conditioning circuit also monitoring a "loss of magnetic field" condition. (read more)
Avago Tech's Miniature Signal Conditioning IC
Mouser Electronics, Inc., known for its rapid introduction of the newest products, today announced it is now stocking the APDS-9700 miniature single-chip signal conditioning IC from Avago Technologies, a leading supplier of analog interface components for communications, industrial, and consumer applications. (read more)
Parts by Number for IC inspection
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| F350U005E | PLC Radwell | OMRON | Not Provided | IC PACKAGE INSPECTION 1 SW |
| IDT76T1200BH | Digi-Key | IDT, Integrated Device Technology Inc | Integrated Circuits (ICs) | IC INSPECTION ENG PAX 481-BGA |
Conduct Research
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MEMS Inspection and Testing
MEMS inspection and testing encompasses physical and chemical examination of structures using SEM or optical microscopy, ellipsometry, spectroscopy or other analytical technique. MEMS testing is...(read more)
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Analysis via SEM / EDS (.pdf)
The use of Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in the analysis of failure related issues of printed circuit boards (PCBs), assemblies (PCAs), and electronic...(read more)
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NASA Goddard Tin Whisker Homepage "HP Experience with Tin Whisker Inspection Training", V. Schroeder, circa August 2005 |
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Automatic vision inspection system for IC packaging... Automatic vision inspection system for IC packaging substrate |
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Automatic vision inspection system for IC packaging... Automatic vision inspection system for IC packaging substrate b- Powerful Inspection systemb ul liWorld-First under-PSR inspection capa.. |
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Bump inspection apparatus and method for ic component, bump... Bump inspection apparatus and method for ic component, bump forming method for ic component, and mounting method for ic component |
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Driver ic and inspection method for driver ic and output... Driver ic and inspection method for driver ic and output device -> Monitor Keywords Driver ic and inspection method for driver ic and output device |
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International Rectifier - Application Notes Embedded 8051 Application Development for IRMCF/K300 Series Motor Control IC PDF Power QFN® Technology Inspection Application Note PDF See International Rectifier Information |
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IC Radius Buffer Overflow Vulnerability Deep Inspection 5.3r5 and above, 5.4, 6.0 #1500 posted: 09/09/09 Deep Inspection 5.1 and 5.2 #1435 posted: 09/09/09 See Juniper Networks Inc. Information |
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A high speed image preprocessing method for IC wafer... A high speed image preprocessing method for IC wafer inspection |
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Rule-based inspection of leadframes (IC manufacture) Rule-based inspection of leadframes (IC manufacture) |
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Untitled Bump inspection apparatus and method for IC component, bump forming method for IC component, and mounting method for IC component |
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