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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find x-ray measurement-related products, suppliers, datasheets and CAD.
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Products/Services for x-ray measurement
Willick Engineering's custom vaults and cabinets incorporate Willick's exclusive total encapsulation design -no exposed lead - a steel bonded attenuation barrier supported by a strong steel framework.
All X-ray radiation safety enclosures are professionally assembled and tested at your site. (read more)
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More
...and precision sample stages or positioners. The high resolution is required for the 2D or 3D measurement of semiconductor wafers, electronics or other high precision components or in capturing microstructural or biological features. Imaging... Search by Specification | Learn More
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More
Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF Search by Specification | Learn More
Machine vision systems are used for automated inspection and measurement in production environments. Search by Specification | Learn More
Humidity measurement instruments test for absolute humidity, relative humidity, or dew point in air. Search by Specification | Learn More
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More
Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc Search by Specification | Learn More
, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More
Test, inspection and measurement software is used to design, automate and implement the testing of instruments and equipment, and the measurement of device parameters. Search by Specification | Learn More
...include radiography or X-ray analysis, laser holography or gaging, penetrant testing, and magnetic particle testing. Acoustic emission instruments and noise detectors are non-destructive testing (NDT) supplies and accessories for monitoring... Search by Specification | Learn More
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Willick X-Ray Safety Vaults Willick Engineering
Kodak Computed Radiography Digital Systems Willick Engineering
High Frequency Industrial X-Ray Machines Willick Engineering
Lightweight Portable X-Ray Equipment Willick Engineering
X-Scope Real-Time X-Ray System NDT Scienscope International Corporation
160 kV Open Type Microfocus X-ray Source (MFX) Hamamatsu Corporation USA
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Product News for x-ray measurement
PXS4-611W, 60 kV X-Ray Source
The PXS4-611W is a water cooled side-window X-Ray source for analytical and gauging applications. It features highly stable flux for reliable gauging measurements. Operating voltage is from 5kV - 60kV at up to 60W. The focal spot is 0.25mm x 0.45mm at 60W and the Focus-to-Object Distance (FOD) is 15.8mm. The unit houses a sealed tube and high voltage power supply. (read more)
PXS6-130SW, 130 kV X-Ray Source
The PXS6-130SW is a water cooled side-window X-Ray source for analytical and gauging applications. It features highly stable flux for reliable gauging measurements. Operating voltage is from 20kV - 130kV at up to 65W. The focal spot is 0.5mm at 65W and the Focus-to-Object Distance (FOD) is 26.7mm. The unit houses a sealed tube and high voltage power supply. (read more)
X-Ray Services
Conventional X-Ray systems cannot furnish the same level of detail or observe the interior of moving systems in real time–as is possible with this sophisticated Real-Time X-Ray System. Trace is one of a very few independent test labs to offer this service as part of their Root Cause Failure Analysis program. (read more)
X-Scope Real-Time X-Ray System NDT
Introducing a brand new design and model to improve your quality control without hurting your bottom line. Scienscope X-Scope inspection system is an affordable, yet extremely powerful solution. FDA Approved. (read more)
Medical Component Testing with X-ray Fluorescence
Users of commercial off the shelf components are faced with a potentially dangerous parts shortage. It is possible that electronics thought to contain a minimum percentage of tin lead specified for medical components will be mislabeled and replaced with lead-free components. Fischer X-ray fluorescence instruments identify lead and lead free components. (read more)
X-ray Spectrometer for Quantitative Analysis
X-Ray Fluorescence Instruments for WEEE/RoHS by Fischer Technology The FISCHERSCOPE X-RAY XAN and XDAL identify the content of prohibited metals in compliance to the EU directive RoHS/WEEE (read more)
Material Analysis with X-ray Spectrometers
X-Ray fluorescence is a highly effective tool for materials analysis.
It is widely used for coating thickness measurement and is also well suited for element identification.
Powder and paste can be analyzed in the same manner as solid materials or liquids. Fast results are possible with our X-Ray Fluorescence Testing for WEEE and RoHS compliance. (read more)
New generation of FISCHERSCOPE® X-RAY
The newest generation of the proven FISCHERSCOPE® XDAL and XDLM x-ray spectrometers is now available. (read more)
EDX-GP X-ray Fluorescence Spectrometer
The EDX-GP, the newest model in Shimadzu's EDX series, offers fast, high-sensitivity measurements optimized for RoHS/ELV hazardous element screening with easy, automatic operation for first-time users. (read more)
Custom X-ray Instruments and X-ray Systems
VJ Technologies, Inc. offers leading-edge solutions for the most advanced X-ray imaging applications. They offer custom X-ray Instruments and X-ray System solutions. (read more)
Conduct Research
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Practical Application Of Nondestructive Residual Stress Measurements By X-ray Diffraction (.pdf)
A modified Integral Method was investigated as a means to nondestructively measure the subsurface residual stress distribution. The technique has been demonstrated to be feasible in aluminum alloys by...(read more)
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Problems With Non-destructive Surface X-ray Diffraction Residual Stress Measurement (.pdf)
Because surface measurements are non-destructive, xray diffraction is often considered as a method of residual stress measurement for quality control testing. Unfortunately, errors caused by the...(read more)
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Problems with Non-Destructive Surface X-ray Diffraction Residual Stress Measurement, Part 1 (.pdf)
Because surface measurements are non-destructive, x-ray diffraction is often considered as a method of residual stress measurement for quality control testing. Unfortunately, errors caused by the...(read more)
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Miniature X-Ray Tubes Utilizing Carbon-Nanotube-Based Cold Cathodes
The electron field-emission properties of carbon nanotubes enable the fabrication of cold cathodes for a variety of vacuum device applications. The utilization of these cathodes is an attractive...(read more)
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Current Applications Of X-ray Diffraction Residual Stress Measurement (.pdf)
A brief theoretical development of x-ray diffraction residual stress measurement is presented emphasizing practical engineering applications of the plane-stress model, which requires no external...(read more)
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X-ray Diffraction Characterization Of Residual Stresses Produced By Shot Peening (.pdf)
A brief overview of the theory and practice of x-ray diffraction residual stress measurement as applied to shot peened materials is presented. The unique ability of x-ray diffraction methods to...(read more)
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Problems with Non-Destructive Surface X-ray Diffraction Residual Stress Measurement, Part 3 (.pdf)
This article concerning errors in the measurement of the surface stress caused by the penetration of the x-ray beam is the third and final article in a series addressing the difficulties encountered...(read more)
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X-ray Diffraction Residual Stress Techniques (.pdf)
In x-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the...(read more)
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Selecting the Appropriate X-ray Fluorescence Instrument for High Reliability Electronic Components and WEEE/RoHS Screening
The Waste Electrical and Electronic Equipment (WEEE) and Restriction of the use of certain Hazardous Substances (RoHS) directives require electronic components testing by both the commercial and High...(read more)
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Characterization Techniques for Miniature Lowpower X-Ray Tubes
An X-ray shielded test chamber has been designed and built that includes a CCD-pinhole camera and energy-dispersive silicon PIN-diode detector for spectrum collection. The use of this chamber is an...(read more)
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X-ray - Wikipedia, the free encyclopedia Originally, the electromagnetic radiation emitted by X-ray tubes had a longer wavelength than the radiation emitted by radioactive nuclei (gamma |
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NIST X-ray Photoelectron Spectroscopy (XPS) Database,... NIST X-ray Photoelectron Spectroscopy Database NIST Standard Reference Database 20, Version 3.5 Data compiled and evaluated by |
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NIST Phys. Lab. - Vacuum Double-Crystal Spectrom. X-Ray and Gamma-Ray Metrology X-ray and gamma-ray wavelengths |
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A new look at the age of the universe Astronomers plan X-ray measurements of galaxy clusters for a new measurement of the Hubble Constant |
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Imagine the Universe! Dictionary The scientists, programmers and technicians working here study the astrophysics of objects which emit cosmic ray, x-ray and gamma-ray radiation. |
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Microbeam XRF Benchtop System-Thermo Scientific Product Browse Products >>... >> X-Ray Spectroscopy - Diffractometry >> Microbeam XRF MicroXR GXR Microbeam X-ray Fluorescence System |
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Thermo Scientific X-Ray Master Sensor-Thermo Scientific X-Ray Master Sensor The X-Ray Master Sensor provides |
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Welcome to phoenix|x-ray! About phoenix|x-ray phoenix|x-ray is the product-line of GE Sensing & Inspection Technologies for See phoenix | x-ray Systems + Services Inc. Information |
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ASTM E915 -96(2002) Standard Test Method for Verifying the... ASTM E915 - 96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement See ASTM International Information |
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Statistical Analysis of X-ray Residual Stress Measurement... Statistical Analysis of X-ray Residual Stress Measurement Using the Half-Width Method Kurita, M Associate professor, Technological University of See ASTM International Information |
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