X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More

X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More

X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More

Machine vision systems are used for automated inspection and measurement in production environments. Search by Specification | Learn More

...and radiographic or X-ray inspection. General NDT supplies and accessories include alloy identifiers, spot test kits, cables and adaptors, descalers and pickles, flaw markers, holders and clamps, illuminators and light meters, and magnifiers and mirrors... Search by Specification | Learn More

Non-destructive testing (NDT) services use test methods to examine an object, material or system without impairing its future usefulness. Search by Specification | Learn More

Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More

...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More

Inspection accessories, layout accessories and gaging accessories include probes, sensors, hand tools, styli, contact tips, supplies and other components for dimensional measurement, inspecting, marking, layout or other manufacturing or machine shop Learn More

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system Search by Specification | Learn More

...that can be stored into on-board memory or non-volatile storage. The maximum inspection rate is the maximum number of parts or process steps that can be inspected or evaluated per unit time. This is usually given in units of inspections per second. Other... Search by Specification | Learn More

Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF Search by Specification | Learn More

...signals the framegrabber can handle simultaneously. High-resolution cameras support camera inputs greater than 1000 x 1000 pixels. Output choices for frame grabbers include RS170, CCIR, RS330, RS422, NTSC, Y/C, RGB, PAL, SVGA, and VGA. Common... Search by Specification | Learn More

...include radiography or X-ray analysis, laser holography or gaging, penetrant testing, and magnetic particle testing. Acoustic emission instruments and noise detectors are non-destructive testing (NDT) supplies and accessories for monitoring... Search by Specification | Learn More