Electronics or Semiconductor Inspection Imaging Workstations Datasheets

• System Type: Modular; Turnkey 
• Feature Resolution: 0.0030 mm

• Inspection Rate: 30.00 inspections per second
• Network: Gigabit Ethernet 

Designed around our popular 6X Close Focus Zoom Lens, these imaging video systems provide the versatility and short working distance required for a variety applications. The lens is able to cover an 8mm to 110mm field of view (horizontally, using a 1/2" sensor). The system is available with the...[See More]

• System Type: Turnkey 
• Image Source: AreaScan 

• Applications: Edge Detection; Electronics or semiconductor inspection; Electronics rework station; Flaws; Gauge; Materials Analysis; Tool & Die Monitoring 
• Stage Type: None 

The iNEXIV VMA-2520 is a new multi-sensor measuring system that's lightweight and compact enough to be used in the factory on the bench top, with fast, fully automatic and high accuracy features that make it ideally suited for a wide variety of industrial measuring, inspection and quality control...[See More]

• System Type: Modular 
• Memory: 1000 MB

• Feature Resolution: 1.00E-4 mm
• Operating System: Windows® XP Pro SP2 or later 

The Olympus MX51 industrial inspection microscope is optimized for the inspection requirements of a variety of electronic components including semiconductor wafer inspection. Its compact size, ease of operation, 6"x6" stage travel and cost effectiveness make the MX51 an ideal inspection microscope...[See More]

• Applications: Electronics or semiconductor inspection; Flaws 
• Stage Type: XY 

• Image Source: Microscope 
• Modules Included: Integral Cameras or Imagers (optional feature); Integral Illuminators 

Scienscope Macro Zoom lens is designed for large filed of views, large range of working distance, and large depth of field applications. Range from 7" - 12" of working distance with a close-up/cover lens and from 11" to infinity without the close-up/cover lens. Up to 61.9 magnification.[See More]

• System Type: Modular 
• Image Source: AreaScan 

• Applications: Assembly; Electronics or semiconductor inspection; Gauge; Production & Quality Control; Other; Large Field of View Applications 
• Stage Type: Integral Camera Positioner or Stage 

WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features a sturdy...[See More]

• System Type: Modular 
• Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or semiconductor inspection; Flaws; Gauge; Profilometry; Production & Quality Control; Other; Bare Glass Thickness and Defect 

• Network: RS232 
• Image Source: LineScan; Microscope; Confocal Laser