Flaw Detection Imaging Workstations Datasheets

• System Type: Modular; Turnkey 
• Feature Resolution: 0.0030 mm

• Inspection Rate: 30.00 inspections per second
• Network: Gigabit Ethernet 

Combine portability with flexible phosphor imaging plates for a CR system that can cut down your time on each NDT job. No more waiting as film is developed. Just wrap the flexible plate around your subject, expose, and process – digitally.[See More]

• System Type: Modular; Turnkey 
• Image Source: Phosphor Imaging Plate 

• Applications: Flaws; Other; Computed Radiography System 
• Modules Included: Image Processing & Analysis Software 

Designed around our popular 6X Close Focus Zoom Lens, these imaging video systems provide the versatility and short working distance required for a variety applications. The lens is able to cover an 8mm to 110mm field of view (horizontally, using a 1/2" sensor). The system is available with the...[See More]

• System Type: Turnkey 
• Image Source: AreaScan 

• Applications: Edge Detection; Electronics or semiconductor inspection; Electronics rework station; Flaws; Gauge; Materials Analysis; Tool & Die Monitoring 
• Stage Type: None 

The piston inspection system DP 346 is designed for high-throughput X-ray inspection of light-metal pistons. With its ergonomic top-loading design, shorter cycle times can be achieved. Due to flexibility, it can accomodate different piston diameters and lengths. Product Features Turnkey system...[See More]

• System Type: Turnkey 
• Image Source: X-ray 

• Applications: Flaws 
• Stage Type: None 

The DS-2M models offer high frame rates and increased sensitivity in a 2 million pixel 1/2 inch format CCD, featuring multiple live capture modes, picture sizes and digital transfer rates, with video display rates of up to 30 frames per second possible. Together with the L2 or U2 Digital Sight...[See More]

• System Type: Modular 
• Applications: Biotechnology or Medical; Electronics or semiconductor inspection; Flaws; Gauge; Production & Quality Control; Tool & Die Monitoring 

• Network: 10/100 Base-TX 
• Image Source: AreaScan; Microscope; B/W or Color CCD Camera 

The Olympus MX51 industrial inspection microscope is optimized for the inspection requirements of a variety of electronic components including semiconductor wafer inspection. Its compact size, ease of operation, 6"x6" stage travel and cost effectiveness make the MX51 an ideal inspection microscope...[See More]

• Applications: Electronics or semiconductor inspection; Flaws 
• Stage Type: XY 

• Image Source: Microscope 
• Modules Included: Integral Cameras or Imagers (optional feature); Integral Illuminators 

Scienscope video measurement systems are specifically designed for non-contact measurement and inspection of small, delicate, or complex components. They are the next generation of traditional measuring measuring microscopes and optical comparator. We have a variety of models to best fit your needs.[See More]

• System Type: Modular 
• Applications: Edge Detection; Flaws; Production & Quality Control; Other; Non Contact Measurement 

• Feature Resolution: 1.00E-3 mm
• Image Source: AreaScan 

WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features a sturdy...[See More]

• System Type: Modular 
• Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or semiconductor inspection; Flaws; Gauge; Profilometry; Production & Quality Control; Other; Bare Glass Thickness and Defect 

• Network: RS232 
• Image Source: LineScan; Microscope; Confocal Laser