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Non-contact Profilometry Imaging Workstations Datasheets
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Other Imaging Workstations
Applications / Capabilities: »
System Type: » |
CrossCheck™ Laser Profile System
from Bytewise Measurement Systems Laser profile sensor, industrial sensor controller, software
Automated Optical Inspection -- MIC4-AOI
from WDI Wise Device Inc. WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features a sturdy...[See More]
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