X-Y Stage Imaging Workstations Datasheets

The Olympus MX51 industrial inspection microscope is optimized for the inspection requirements of a variety of electronic components including semiconductor wafer inspection. Its compact size, ease of operation, 6"x6" stage travel and cost effectiveness make the MX51 an ideal inspection microscope...[See More]

• Applications: Electronics or semiconductor inspection; Flaws 
• Stage Type: XY 

• Image Source: Microscope 
• Modules Included: Integral Cameras or Imagers (optional feature); Integral Illuminators 

Scienscope video measurement systems are specifically designed for non-contact measurement and inspection of small, delicate, or complex components. They are the next generation of traditional measuring measuring microscopes and optical comparator. We have a variety of models to best fit your needs.[See More]

• System Type: Modular 
• Applications: Edge Detection; Flaws; Production & Quality Control; Other; Non Contact Measurement 

• Feature Resolution: 1.00E-3 mm
• Image Source: AreaScan 

The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.[See More]

• System Type: Modular 
• Image Source: AreaScan (optional feature); LineScan (optional feature); Thermal; Microscope; Confocal Laser 

• Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or semiconductor inspection; Flaws; Gauge; Profilometry; Production & Quality Control 
• Stage Type: XY; Integral Camera Positioner or Stage